Overview

This X-ray fluorescence microscope allows non-destructive qualitative and quantitative elemental analysis and mapping of solid samples, using the EDX technique. Compared with SEM/EDX, Orbis PC Micro-EDXRF offers a much higher sensitivity for many elements. It provides powerful analytical capabilities in a variety of analytical applications, such as materials, geology, non-destructive testing, process control, and criminal forensics, to name a few. This instrument can be applied to analyzing clay types and impurities in clays in oil sands without requiring solids digestion.

LMACS Name

Orbis PC Micro-XRF Elemental Analyzer

Confluence Label

edax-orbis-pc-micro-xrf

Process Area

Characterization

Model

Orbis PC Micro

VendorEDAX, (Ametek)
Team




System Features

Max sample size 8 x 8 x 8 mm
sample formatpowder, bulk (or liquid- cannot use vacuum)
Detectable Elementany element heavier than sodium
SourceRh Target
Results Output point analysis, line scan, or mapping

Key Documents

SOPXRF SOP
Hazard AssessmentXRF HA

Related Documents