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nanoFAB Equipment
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JA Woollam M-2000 Ellipsometer
Overview
LMACS Name
Ellipsometer (M-2000V)
Confluence Label
JA woollam-m2000-ellipsometer
Process Area
Characterization
Model
M-2000V
Vendor
J.A. Woollam
Team
Fenglin Liu
Devin Fortier
Peng Li
System Features
370–1000 nm spectral range
1.6 nm pixel resolution; 5 nm bandwidth
Reflection (R) intensity
Transmission (T) intensity
Depolarization, Mueller-matrix
Key Documents
SOP
Hazard Assessment
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