Overview

The benchtop nGauge AFM allows nanoscale topography data collection and operates in tapping mode. It generates topography, phase, and error images simultaneously for any solid samples (including conductive and non-conductive, but not liquid samples). nGauge AFM tips are made of durable materials like diamond-like carbon (DLC) and aluminum oxide, which are also integrated onto the AFM chip. 

LMACS Name

nGauge AFM

Confluence LabelnGauge-AFM
Process Area

Characterization

ModelnGauge AFM 1.2
VendorICSPI
Team

Peng Li  Nastaran Yousefi Timothy Harrison Fenglin Liu 

Location

CMEB L2 - 128



System Features

Images: Topography, Phase, Error
Max sample size: 100 mm x 50 mm x 16 mm
Max scan area: 20 x 20 μm (with a Z Range of 10 μm)
Max scan resolution: 1024 x 1024 pixels (5 minutes)

Scan speed: 80 seconds (256 x 256 pixel, 20 x 20 μm)

Noise floor: <0.5 nm rms
XY Scanner resolution: <0.5 nm

Gwyddion software (Free) for data analysis

Related Documents

Operating Procedure

nGuage AFM SOP, nGauge AFM Optical Microscope Setup, nGauge AFM Chip Handling

Product Brochure

nGauge AFM Brochure

nanoFAB Newspost

nGauge AFM