The Variable Angle Spectroscopic Ellipsometer is capable of high accuracy measurement of various optical properties of thin film materials. It is primarily used to measure the film thickness and/or optical constants from a thin film. Analysis is simplest for single-layer films deposited on a Si substrate, although analysis of multilayer specimens is also reasonably straightforward.
Peng Li / Shihong Xu - can we clarify which system this page is for? VB-250 or M2000? I presume the 250 since the upgrade page is attached here. If that's true - will need to create a second page for the M-2000V
For now I will record the SN / UofA tags for the M-2000V here - it seems the inventory people were very enthusiastic when tagging this system, there are so many. We can transfer later