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Shihong Xu
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Surface Characterization
Activity
Zeiss Zeiss Versa Xradia 620 SOP
updated Sep 11, 2022
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TOF-SIMS Imaging Spectrometer
updated May 06, 2021
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TOFSIMS.jpg
attached May 06, 2021
JEOL JAMP 9500F
updated May 06, 2021
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AugerJAMP9500.jpg
attached May 06, 2021
Tescan Vega-3 SEM
updated May 06, 2021
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FTIR (8700) spectrometer
updated May 06, 2021
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tescanvega3-1554746855.jpg
attached May 06, 2021
Sample Compatibility and Analysis for Major Tools of Characterization Group
updated Oct 09, 2020
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CasaXPS Library Files for Kratos Ultra and PHI VPIII
updated Sep 17, 2020
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Personal
Full Name
Shihong Xu
Email
shihongx@ualberta.ca
Phone
780.918.0523
IM
Website
Company
Position
Applications/Research Specialist
Department
Characterization
Location
W1-028A
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