Overview

Atomic force Microscope, or AFM, is a high resolution form of scanning probe microscopy that employs a sharp tip in a raster motion to measure and visualize materials at the atomic and nano scales.  

LMACS Name

Atomic Force Microscope (Dimension Edge)

Confluence Label

bruker-dimension-edge-afm

Process Area

Characterization

ModelDimension Edge
VendorBruker
Team



System Features

Dimension Edge Specifications
X-Y scan range90 micron x 90 micron
Z Range10 micron typical in imaging and force ramp modes
Motorized stage150 mmx 150 mm inspection area
Close loop scanneryes
Sample/Size150mm vacuum chuck, 15 mm thick
Single Point SpectroscopyThree axis closed loop control for force measurement.  Spring constant calibration with built-in thermal tuning.
AFM ModesContact mode, tapping mode, Force measurement,  LiftMode, Magnetic Force Microscopy, Surface Potential Microscopy