System Features
1. | Atomic Spatial Resolution (< 0.1 nm for HAADF imaging at 200 kV) | |||
|---|---|---|---|---|
2. | Large collection angle (1.0 srad) SDD EDX enabling fast elemental mapping at atomic resolution | |||
| 3. | Four detectors (DF, BF, SE/BSE) are available for STEM images | |||
| 4. | Two CCD cameras available for TEM imaging: upper camera dedicated to diffraction imaging and a lower camera for high resolution imaging | |||
| 5. | Low accelerating voltages (80 kV and 60 kV) available for soft material analysis with enhanced contrast and reduced beam damage | |||
| 6. | Single tilt and double tilt holders | |||
| 7. | A single high tilt tomography (+/- 90 deg) imaging holder is available | |||
Training Pre-Requisites
Starting , all trainees on the JEOL ARM 200cf S/TEM at the nanoFAB are required to complete an online training course before they can start their first hands on training.
| Delivery | eClass External |
|---|---|
| Course Name | JEOL ARM 200cf S/TEM Training |
Please note, this training is delivered through eClass External. For more information please review University of Alberta - eClass External.
Documents
| Operating Procedure | |
| Hazard Assessment |