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Semiconductor characterization of resistivity, carrier concentration and mobility utilizing the hall effect. |
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Contacts
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System Features
| Basic | With Buffer option | |
| Possible Measurement Configurations | Van der Pauw, Hall Bar and Bridge measurements | Van der Pauw, Hall Bar and Bridge measurements |
| Magnet | Rare earth permanent magnet, 0.320 Tesla, 0.1% stability | Rare earth permanent magnet, 0.320 Tesla, 0.1% stability |
| Sample Size | up to 3” | up to 3” |
| Current Range | 100nA - 20mA | 1pA - 10mA |
| Voltage Range | 4mV - 200mV | 4mV - 200mV |
| Resistivity Range | 10-4 - 106 Ohm/square | 10-1 - 1011 Ohm/square |
| Carrier Concentration Range | 106 - 1021 cm-3 | |
| Carrier Mobility Range | 1 - 107 cm2V-1s-1 |
Key Documents
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| Hazard Assessment |
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Staff Documents
Drive Folder
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Related Documents
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