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The Keithley 4200-Semiconductor Characterization System (SCS Parameter Analyzer) (with probe station) provides electrical characterization of materials, semiconductor devices, and processes. |
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Contacts
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System Features
| Measurement Type | I-V & C-V sweeps Advanced ultrafast pulsed I-V, Waveform capture, Transient I-V, |
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| Temperature Stage | –25 °C to 150 °C |
| Probe Station | Signatone WL-1160 |
| Max watts | 2.1 w |
| Frequency range | 1kHz to 10MHz variable. |
| Current Range: | ±100mA, 7 ranges from 100nA to 100mA full scale. |
| Voltage Range: | ±210V, 4 ranges from 200mV to 210V full scale |
Key Documents
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| Hazard Assessment |
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Staff Documents
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Related Documents
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