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Two-dimensional surface topography profiler with sub-8-angstrom step height repeatability and sub-angstrom resolution. Ideal for thin-film profilometry and measuring the step height of various materials. |
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Contacts
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System Features
Wafer Handling | pieces | 100 mm | 150 mm |
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Key Documents
Stage Raising Instructions |
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Wafer Handling |
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Staff Documents
Drive Folder
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Related Documents
Content by Label | ||
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