X-ray diffraction (XRD) is a technique primarily used for phase identification of a crystalline material and can provide structure information on unit cell dimensions. It is also used for crystallinity determination if the samples contain both crystalline and amorphours phase. 

Condition required for diffraction has to fulfill Bragg's Law

reference: https://www.rigaku.com/journal/summer-2008-volume-24-no-1/10-15

Powder XRD sample usually use out-of-plane technique by scan 2Theta/theta for phase identification. 

For thin film sample, the typical scan is fixed glancing angle as omega, and perform 2Theta scan. Sometimes, in-plane scan of 2Theta/Phi/Chai could be used for phase ID and crystal structure if the interested phase is different to substrate normal. 

Focus beam will provide more flux of x-ray to sample. It penetrate deeper to the sample (~3-4 um for stainless steel, 2mm for organic).  While PB has ca. 1/10 flux of the FB, and is less sensitive to sample morphology and is usually used for sample with uneven surface. PB is also use for glancing angle analysis as well because the penetration is less. Rigaku equipped with advanced Cross Beam Optics (CBO) unit in the incident X-ray beam, FB or PB can be switched by simply pushing in the selectable slit. 

Focus Beam or Parallel Beam

reference: https://www.rigaku.com/newsletters/mabu/december2015/RigakuJournal_XRD.pdf

X-ray diffraction (XRD) is a technique primarily used for phase identification of a crystalline material and can provide structure information on unit cell dimensions. It is also used for crystallinity determination if the samples contain both crystalline and amorphours phase. 

Condition required for diffraction has to fulfill Bragg's Law

reference: https://www.rigaku.com/journal/summer-2008-volume-24-no-1/10-15

Powder XRD sample usually use out-of-plane technique by scan 2Theta/theta for phase identification. 

For thin film sample, the typical scan is fixed glancing angle as omega, and perform 2Theta scan. Sometimes, in-plane scan of 2Theta/Phi/Chai could be used for phase ID and crystal structure if the interested phase is different to substrate normal. 

Focus beam will provide more flux of x-ray to sample. It penetrate deeper to the sample (~3-4 um for stainless steel, 2mm for organic).  While PB has ca. 1/10 flux of the FB, and is less sensitive to sample morphology and is usually used for sample with uneven surface. PB is also use for glancing angle analysis as well because the penetration is less. Rigaku equipped with advanced Cross Beam Optics (CBO) unit in the incident X-ray beam, FB or PB can be switched by simply pushing in the selectable slit. 

Focus Beam or Parallel Beam

reference: https://www.rigaku.com/newsletters/mabu/december2015/RigakuJournal_XRD.pdf

X-ray diffraction (XRD) is a technique primarily used for phase identification of a crystalline material and can provide structure information on unit cell dimensions. It is also used for crystallinity determination if the samples contain both crystalline and amorphours phase. 

Condition required for diffraction has to fulfill Bragg's Law

reference: https://www.rigaku.com/journal/summer-2008-volume-24-no-1/10-15

Powder XRD sample usually use out-of-plane technique by scan 2Theta/theta for phase identification. 

For thin film sample, the typical scan is fixed glancing angle as omega, and perform 2Theta scan. Sometimes, in-plane scan of 2Theta/Phi/Chai could be used for phase ID and crystal structure if the interested phase is different to substrate normal. 

Focus beam will provide more flux of x-ray to sample. It penetrate deeper to the sample (~3-4 um for stainless steel, 2mm for organic).  While PB has ca. 1/10 flux of the FB, and is less sensitive to sample morphology and is usually used for sample with uneven surface. PB is also use for glancing angle analysis as well because the penetration is less. Rigaku equipped with advanced Cross Beam Optics (CBO) unit in the incident X-ray beam, FB or PB can be switched by simply pushing in the selectable slit. 

Focus Beam or Parallel Beam

reference: https://www.rigaku.com/newsletters/mabu/december2015/RigakuJournal_XRD.pdf

X-ray diffraction (XRD) is a technique primarily used for phase identification of a crystalline material and can provide structure information on unit cell dimensions. It is also used for crystallinity determination if the samples contain both crystalline and amorphours phase. 

Condition required for diffraction has to fulfill Bragg's Law

reference: https://www.rigaku.com/journal/summer-2008-volume-24-no-1/10-15

Powder XRD sample usually use out-of-plane technique by scan 2Theta/theta for phase identification. 

For thin film sample, the typical scan is fixed glancing angle as omega, and perform 2Theta scan. Sometimes, in-plane scan of 2Theta/Phi/Chai could be used for phase ID and crystal structure if the interested phase is different to substrate normal. 

Focus beam will provide more flux of x-ray to sample. It penetrate deeper to the sample (~3-4 um for stainless steel, 2mm for organic).  While PB has ca. 1/10 flux of the FB, and is less sensitive to sample morphology and is usually used for sample with uneven surface. PB is also use for glancing angle analysis as well because the penetration is less. Rigaku equipped with advanced Cross Beam Optics (CBO) unit in the incident X-ray beam, FB or PB can be switched by simply pushing in the selectable slit. 

Focus Beam or Parallel Beam

reference: https://www.rigaku.com/newsletters/mabu/december2015/RigakuJournal_XRD.pdf