Overview

The Keithley 4200-Semiconductor Characterization System (SCS Parameter Analyzer) (with probe station) provides electrical characterization of materials, semiconductor devices, and processes.

LMACS Name

Keithley 4200-Semiconductor Characterization System (SCS Analyzer)

Confluence Label

keithley-4200-scs-analyzer

Process Area

Characterization

Model4200
VendorTEKTRONIX, INC.
Team

Nancy Zhang Devin Fortier 



System Features

Measurement TypeI-V & C-V sweeps
Advanced ultrafast pulsed I-V, 
Waveform capture,
Transient I-V, 
Temperature Stage –25 °C to 150 °C
Probe StationSignatone WL-1160
Max watts2.1 w
Frequency range1kHz to 10MHz variable.
Current Range: ±100mA, 7 ranges from 100nA to
100mA full scale.
Voltage Range: ±210V, 4 ranges from 200mV to
210V full scale


Key Documents

SOP
Hazard Assessment

Keithley 4200 SCS Analyzer -HA

Related Documents